Cantilever Tip-based Processes

Lead Faculty Research: Bill King (MechSE, Illinois)
Lead Faculty Researcher:
William P. King, MechSE, Illinois

The Center is developing heated or electrically controlled atomic force microscope (AFM) cantilever tips, fabricated from doped silicon crystal silicon, as nano-tools for unique fabrication processes and transforming surfaces including printing, soldiering, sculpting, localized surface manipulation, materials characterization and metrology applications.  This process has the advantage of using the AFM probe to locate the precise location on a substrate for the activity.

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